Publications by Christos Faloutsos

Conference

Metric forensics

2010 • Proceedings of the ACM SIGKDD International Conference on Knowledge Discovery and Data Mining • 163-172
Henderson K, Eliassi-Rad T, Faloutsos C, Akoglu L, Li L, Maruhashi K, Prakash BA, Tong H
Displaying 51 - 63 of 63